EBSD-Analysis of Microstructural Changes Below Wire-EDMed Surfaces
نویسندگان
چکیده
منابع مشابه
A New Microstructural Imaging Approach through EBSD Pattern Region of Interest Analysis
The requirements of a highly tilted sample and a well-polished surface for optimal EBSD pattern collection can make traditional SEM imaging challenging. With a tilted sample, SEM SE and BSE detectors are often in non-optimal positions for electron detection. For many materials, the polished surfaces produce weak contrast with SE imaging. Traditionally placed BSE detectors must be used with care...
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Alt’s thread problem asks for least-area surfaces bounding a fixed “wire” curve and a movable “thread” curve of length L. We conjecture that if the wire has finitely many maxima of curvature, then its Alt minimizers have finitely many surface components. We show that this conjecture reduces to controlling near-wire minimizers, and thus begin a three paper series to understand them. In this pape...
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Electron backscatter diffraction (EBSD) has evolved into a well-established tool for microstructural characterization by providing quantitative information on crystallographic orientation and phase content and distribution. The rapid acceptance of EBSD as an analytical technique has been driven, in part, by the highly informative contrasts used to create different micrographs which effectively ...
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The microtexture of differently prepared Ba-hexaferrite samples is investigated by means of electron backscatter diffraction (EBSD). Kikuchi patterns are obtained with a high image quality, enabling a spatial resolution of the EBSD maps of about 20 nm. The spatially highly resolved EBSD mappings provide additional information (individual grain orientation, misorientation angles, grain size dist...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2014
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927614009088